A Review of the Experimental Performance of TurnOff Methods in Wide Bandgap Semiconductors

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dc.article.end-page1683en
dc.article.start-page1671en
dc.citation.doi10.1109/OJPEL.2024.3478178en
dc.contributor.authorFrancois du Toiten
dc.contributor.authorIvan Hofsajeren
dc.date.accessioned2024-11-25T12:08:18Z
dc.date.available2024-11-25T12:08:18Z
dc.facultyFACULTY OF ENGINEERING & THE BUILT ENVIRONMENTen
dc.identifier.citationSCOPUSen
dc.identifier.issn26441314en
dc.identifier.urihttps://hdl.handle.net/10539/42882
dc.journal.titleA Review of the Experimental Performance of TurnOff Methods in Wide Bandgap Semiconductorsen
dc.journal.volume5en
dc.titleA Review of the Experimental Performance of TurnOff Methods in Wide Bandgap Semiconductorsen
dc.typeJournal Articleen

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