Surface brillouin scattering (SBS) study of photoelastic properties of transparent materials
 No Thumbnail Available 
Date
2019
Authors
Dube, Hlosani Ngqongqotshi
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
Brillouin spectroscopy (BS) was employed to investigate the elastic constants of
bulk (strontium  uoride (SrF2) and thin  lm (silicon carbide (SiC)) materials.
Results of volume scattering experiments on SrF2 provided an excellent baseline
study of bulk modes which proved invaluable in the analysis of the scattering
pro le generated by the complex system of a-SiC  lms grown on transparent substrates
in this unique study.
In this study, SrF2, which has continued to be of technological interest because
of its fast ion conductivity in the vicinity of its melting point, has its elastic constants
measured using Brillouin scattering. Independent elastic constants of SrF2
were determined from SBS measurements and were found to be c11   116 GPa, c12
  45 GPa and c44   33 GPa. These values agree very well with those in literature.
SiC continues to receive intensive interest due to its applicability in micro electromechanical systems (MEMS) operating in harsh environments. In this study,
amorphous thin  lms of SiC were deposited on di erent substrates using magnetron
sputtering.The elastic constants of SiC thin  lms deposited on sapphire
and silicon were obtained by inverse extraction of elastic constants using elastodynamic
Green's function applied to the phonon dispersion curves. The  lms were
characterized using microscopic and x-ray techniques, amongst others. The elastic
constants of the amorphous  lms on sapphire were obtained as c11   250 GPa
and c44   74 GPa and for amorphous  lms on silicon substrate were c11   160
GPa and c44   100 GPa. Some very interesting anomalous loading e ects of the
di erent substrates were observed. The analysis of the dispersion curves of thin
SiC/substrate combinations characterized by sti ness e ects showed the appearance
of anomalous behavior in a range of small normalized thickness. Thus, the
evolution of the dispersion curves are not only in uenced by velocity but also by
densities of the respective  lm/substrate materials.
Description
A dissertation submitted to the Faculty of Science, University of
the Witwatersrand, Johannesburg, in ful llment of the academic
requirements for the degree of Master of Science.
Johannesburg, February 2019