An investigation into a probabilistic digital integrated circuit testability analysis

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dc.contributor.authorFranco, Piero
dc.date.accessioned2015-01-21T08:41:37Z
dc.date.available2015-01-21T08:41:37Z
dc.date.issued2015-01-21
dc.identifier.urihttp://hdl.handle.net/10539/16670
dc.language.isoenen_ZA
dc.titleAn investigation into a probabilistic digital integrated circuit testability analysisen_ZA
dc.typeThesisen_ZA

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