Defects microstructural optical and electrical evolution of NiO nanostructured thin films by 02 MeVu C ion irradiation
| dc.article.end-page | 44632 | en |
| dc.article.start-page | 44619 | en |
| dc.citation.doi | 10.1016/J.CERAMINT.2025.07.190 | en |
| dc.contributor.author | Dineo P Sebuso | en |
| dc.contributor.author | Cosmas Muiva | en |
| dc.contributor.author | Othmane Mouane | en |
| dc.contributor.author | Rudolph Erasmus | en |
| dc.contributor.author | Morgan Madhuku | en |
| dc.contributor.author | Elias Sideras-Haddad | en |
| dc.date.accessioned | 2025-11-03T10:26:35Z | |
| dc.faculty | FACULTY OF SCIENCE | en |
| dc.identifier.citation | WOS | en |
| dc.identifier.issn | 0272-8842 | en |
| dc.identifier.uri | https://hdl.handle.net/10539/47311 | |
| dc.journal.title | Defects microstructural optical and electrical evolution of NiO nanostructured thin films by 02 MeVu C ion irradiation | en |
| dc.journal.volume | 51 | en |
| dc.publisher | ELSEVIER SCI LTD | en |
| dc.title | Defects microstructural optical and electrical evolution of NiO nanostructured thin films by 02 MeVu C ion irradiation | en |
| dc.type | Journal Article | en |
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