Analysis of characteristics of random microstructures of nanomaterials
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Date
2009-03-26T06:26:29Z
Authors
Tengen, Thomas Bobga
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Abstract
Predicting and manipulating materials macroscopic properties from the knowledge of their
microstructure characteristics are attracting significant attention in the field of Materials Science
and Engineering. Nowadays, Nanoscience and Nanotechnology are engaged in these studies.
Nanomaterials constituents, called herein unambiguously microstructures, have inherently
random features/characteristics. In the research reported in this thesis the tools of stochastic
processes and stochastic differential equations theory have been used as they offer a sound
approach to understanding and analysing microstructures characteristics. This research adopts
the approach of first delineating the necessary mathematical formulations, followed by their
applications.
Substantial number of atoms at nanomaterial Grain Boundaries, GBs, lowers the material thermal
stability leading to grain growth. The growth of individual grain size, d, in a nanomaterial is
apprehended to be jointly caused by Grain Boundary Migration, GBM, and Grain Rotation-
Coalescence, GRC, mechanisms. A model is established that includes the previously ignored
GRC in the expression for increment of d and, further, considering the fact that the energy
required to activate GBM increases during grain growth. The stochastic counterpart of the
expression is obtained by adding two fluctuation terms; to account for the random fluctuations in
d caused by GBM and GRC. Results show that nanomaterials low stabilities are also due to their
grains’ high rotational mobilities at low grain size dispersion, CV(d). Using information about
microstructure size evolution, its probability density function, pdf, is determined using the
generalised Fokker-Planck-Kolmogorov equation. Results demonstrate that the type of scaling
state pdf depends on the nature of the fluctuation terms. Grain growth parameters are calibrated
in such a way that the pdf evolves lognormally throughout.
Microstructure-property dependence has for long been given by the Hall-Petch to Reverse Hall-
Petch relationship, HP-RHPR, (a relationship between mechanical property and mean grain size,
E(d), only). A modified model for this dependence is established using complete information
about microstructure size distribution. Results suggest that both E(d) and CV(d) are central in
designing materials with required properties. Reasons for conventional, homologous and
anomalous temperature dependences of yield stress are revealed.
Thus, implementing desired stochastic “properties” of microstructures entails designing required
materials mechanical properties.