Synchrotron studies (and applications) of diamond

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dc.contributor.author Setshedi, Rhyme Kagiso
dc.date.accessioned 2012-02-02T07:51:19Z
dc.date.available 2012-02-02T07:51:19Z
dc.date.issued 2012-02-02
dc.identifier.uri http://hdl.handle.net/10539/11237
dc.description MSc., Faculty of Science, University of the Witwatersrand, 2011 en_US
dc.description.abstract This research focuses on the study of the impurities in low-strain high pressure, high temperature (HPHT) synthetic diamonds. The dominant characterisation methods are synchrotron-based x-ray techniques, supported by other conventional laboratory techniques. The research identifies the role of defects in generating long-range strain. A software programme based on the dynamical theory of x-ray diffraction has specially been developed to quantify the local changes in the lattice parameter and the local lattice inclinations (combined as the “effective misorientation” or local Bragg angle change). In recent measurements, the strain sensitivity of the (quantitative) x-ray plane-wave monochromatic topography was increased to the level of 10−8. This level of sensitivity was achieved using the double crystal technique with successively higher order reflections and correspondingly, higher energy x-rays. This is a level which has never previously been accessed for diamond. Preliminary results for this research have already contributed immensely to driving a technological development of a new range of diamond-based x-ray optical elements for modern third and fourth-generation x-ray sources like synchrotron storage rings and Free Electron Lasers (FEL), where industry (industrial diamond growers) and end-users (the synchrotrons of the world) participate collaboratively in a research and development programme. en_US
dc.language.iso en en_US
dc.subject Physics Diamonds Diamonds, industrial en_US
dc.title Synchrotron studies (and applications) of diamond en_US
dc.type Thesis en_US


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